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Field emission transmission electron microscopy Tecnai G2 F20 S-TWIN
Manufacturer: FEI
Model: Tecnai G2 F20 S-TWIN
Key performance indicators
Acceleration voltage: 20 ~ 200 kV;
The ultimate resolution: 0.14 nm profile information;
STEM resolution: 0.20nm;
FEG minimum beam spot £ 0.3nm;
Camera constant: 30 ~ 4500 mm;
Electron beam maximum convergence angle: ± 13 °;
Remote operation interface, automatic aperture interface;
Electron gun: FEG, energy resolution £ 0.7eV;
Point resolution: 0.24 nm;
Cs (mm) / Cc (mm) 1.2 / 1.2;
TEM magnification: 60 ~ 1000kx;
Maximum inclination of sample: ± 40 °;
Integrated energy spectrometer and CCD camera;
Application range
Widely used in biology, medicine, chemistry, physics, geology, metal, semiconductor materials, polymer materials, ceramics, nano-materials and other fields. It is an indispensable tool for studying the relationship between super-microstructure and properties of various materials.
